Profilometer - QualiSurf III-Plus / Surface Waviness & Roughness Tester
The All-in-One Solution for Roughness & Waviness Analysis
The QualiSurf III Plus is a cutting-edge Portable Stylus Profilometer designed to bridge the gap between handheld roughnes testers and stationary lab instruments. Unlike standard portable units that only measure roughness, the QualiSurf III Plus features a Skid-less pickup system, enabling it to accurately measure Surface Waviness (W) and Primary Profiles (P) in addition to standard Roughness (R).
With a massive 50mm tracing length and a high-resolution touch screen, this device is the ideal solution for workshops, metrology labs, and QA departments requiring detailed surface analysis on curved surfaces, shafts, and complex geometries.
Industrial Applications
Crucial for measuring Waviness (Wt, Wa) on sealing surfaces, camshafts, and crankshafts where standard roughness testers fail.
Test curved turbine blades and airfoils using the Skid-less mode to ensure aerodynamic efficiency and fatigue resistance.
Analyze tribological properties and surface texture to predict wear capability and lubrication retention (Rk, Rpk, Rvk parameters).
Key Features & Capabilities
-
✔
Skid-less & Skidded Measurement: The detachable drive unit supports both modes. Use Skid-less for high-precision waviness and curved surfaces, or Skidded for rapid roughness checks on flat parts.
-
✔
Extended Range: Features a remarkably wide measuring range of up to 1000μm (Y-axis) and a maximum tracing length of 50mm (X-axis), far exceeding typical handheld limits.
-
✔
Advanced Data Interface: Equipped with a 5.7-inch TFT Touch Screen running a Windows-based OS for intuitive navigation. Store up to 10,000 datasets internally or export via USB/RS232.
-
✔
Comprehensive PC Software: Includes powerful analysis software for generating detailed profile graphs, bearing area curves, and quality control reports on a PC.
-
✔
Global Compliance: Fully conforms to major roughness standards: ISO 4287, JIS 0601, ANSI, and SEP 1941.
Standard Delivery Scope
Technical Specifications
| Profiles Analyzed | Roughness (R), Waviness (W), Primary (P), R-Motif, W-Motif |
| Measurement Range | Z-Axis: 1000μm (±500μm) | X-Axis (Drive): 50mm |
| Resolution | Up to 0.0003μm |
| Cutoff Lengths (λc) | 0.08, 0.25, 0.8, 2.5, 5, 8, 10 mm |
| Repeatability | < 3% (Skid-less Mode) / < 1.5% (Skidded Mode) |
| Filters | Gauss, 2RC |
| Interface | USB, RS232, Touch Screen |
| Power Supply | Built-in Rechargeable Li-ion Battery / AC Adapter |
Supported Measurement Parameters
| Standard | Profile | Key Parameters |
|---|---|---|
| ISO 1997 | R / P / W | Ra, Rz, Rq, Rt, Rp, Rv, Rsk, Rku, Rc, RSm, Rmr, Wa, Wq, Wz, Wt, Pa, Pz, Pt... |
| JIS 2001 | R / P / W | Ra, Rq, Rz, RzJIS, Rp, Rv, Rku, Rc, RSm, Wa, WzJIS... |
| ANSI | R / W | Ra, Rq, Rz, Rt, Rmax, Rpm, Wa, Wq, Wz, Wt, Wmax... |
Click Here to visit the product webpage
Product Information
Product Information
Shipping & Returns
Shipping & Returns
Profilometer - QualiSurf III-Plus / Surface Waviness & Roughness Tester
Profilometer - QualiSurf III-Plus / Surface Waviness & Roughness Tester
The All-in-One Solution for Roughness & Waviness Analysis
The QualiSurf III Plus is a cutting-edge Portable Stylus Profilometer designed to bridge the gap between handheld roughnes testers and stationary lab instruments. Unlike standard portable units that only measure roughness, the QualiSurf III Plus features a Skid-less pickup system, enabling it to accurately measure Surface Waviness (W) and Primary Profiles (P) in addition to standard Roughness (R).
With a massive 50mm tracing length and a high-resolution touch screen, this device is the ideal solution for workshops, metrology labs, and QA departments requiring detailed surface analysis on curved surfaces, shafts, and complex geometries.
Industrial Applications
Crucial for measuring Waviness (Wt, Wa) on sealing surfaces, camshafts, and crankshafts where standard roughness testers fail.
Test curved turbine blades and airfoils using the Skid-less mode to ensure aerodynamic efficiency and fatigue resistance.
Analyze tribological properties and surface texture to predict wear capability and lubrication retention (Rk, Rpk, Rvk parameters).
Key Features & Capabilities
-
✔
Skid-less & Skidded Measurement: The detachable drive unit supports both modes. Use Skid-less for high-precision waviness and curved surfaces, or Skidded for rapid roughness checks on flat parts.
-
✔
Extended Range: Features a remarkably wide measuring range of up to 1000μm (Y-axis) and a maximum tracing length of 50mm (X-axis), far exceeding typical handheld limits.
-
✔
Advanced Data Interface: Equipped with a 5.7-inch TFT Touch Screen running a Windows-based OS for intuitive navigation. Store up to 10,000 datasets internally or export via USB/RS232.
-
✔
Comprehensive PC Software: Includes powerful analysis software for generating detailed profile graphs, bearing area curves, and quality control reports on a PC.
-
✔
Global Compliance: Fully conforms to major roughness standards: ISO 4287, JIS 0601, ANSI, and SEP 1941.
Standard Delivery Scope
Technical Specifications
| Profiles Analyzed | Roughness (R), Waviness (W), Primary (P), R-Motif, W-Motif |
| Measurement Range | Z-Axis: 1000μm (±500μm) | X-Axis (Drive): 50mm |
| Resolution | Up to 0.0003μm |
| Cutoff Lengths (λc) | 0.08, 0.25, 0.8, 2.5, 5, 8, 10 mm |
| Repeatability | < 3% (Skid-less Mode) / < 1.5% (Skidded Mode) |
| Filters | Gauss, 2RC |
| Interface | USB, RS232, Touch Screen |
| Power Supply | Built-in Rechargeable Li-ion Battery / AC Adapter |
Supported Measurement Parameters
| Standard | Profile | Key Parameters |
|---|---|---|
| ISO 1997 | R / P / W | Ra, Rz, Rq, Rt, Rp, Rv, Rsk, Rku, Rc, RSm, Rmr, Wa, Wq, Wz, Wt, Pa, Pz, Pt... |
| JIS 2001 | R / P / W | Ra, Rq, Rz, RzJIS, Rp, Rv, Rku, Rc, RSm, Wa, WzJIS... |
| ANSI | R / W | Ra, Rq, Rz, Rt, Rmax, Rpm, Wa, Wq, Wz, Wt, Wmax... |
Click Here to visit the product webpage
Product Information
Product Information
Shipping & Returns
Shipping & Returns
Description
The All-in-One Solution for Roughness & Waviness Analysis
The QualiSurf III Plus is a cutting-edge Portable Stylus Profilometer designed to bridge the gap between handheld roughnes testers and stationary lab instruments. Unlike standard portable units that only measure roughness, the QualiSurf III Plus features a Skid-less pickup system, enabling it to accurately measure Surface Waviness (W) and Primary Profiles (P) in addition to standard Roughness (R).
With a massive 50mm tracing length and a high-resolution touch screen, this device is the ideal solution for workshops, metrology labs, and QA departments requiring detailed surface analysis on curved surfaces, shafts, and complex geometries.
Industrial Applications
Crucial for measuring Waviness (Wt, Wa) on sealing surfaces, camshafts, and crankshafts where standard roughness testers fail.
Test curved turbine blades and airfoils using the Skid-less mode to ensure aerodynamic efficiency and fatigue resistance.
Analyze tribological properties and surface texture to predict wear capability and lubrication retention (Rk, Rpk, Rvk parameters).
Key Features & Capabilities
-
✔
Skid-less & Skidded Measurement: The detachable drive unit supports both modes. Use Skid-less for high-precision waviness and curved surfaces, or Skidded for rapid roughness checks on flat parts.
-
✔
Extended Range: Features a remarkably wide measuring range of up to 1000μm (Y-axis) and a maximum tracing length of 50mm (X-axis), far exceeding typical handheld limits.
-
✔
Advanced Data Interface: Equipped with a 5.7-inch TFT Touch Screen running a Windows-based OS for intuitive navigation. Store up to 10,000 datasets internally or export via USB/RS232.
-
✔
Comprehensive PC Software: Includes powerful analysis software for generating detailed profile graphs, bearing area curves, and quality control reports on a PC.
-
✔
Global Compliance: Fully conforms to major roughness standards: ISO 4287, JIS 0601, ANSI, and SEP 1941.
Standard Delivery Scope
Technical Specifications
| Profiles Analyzed | Roughness (R), Waviness (W), Primary (P), R-Motif, W-Motif |
| Measurement Range | Z-Axis: 1000μm (±500μm) | X-Axis (Drive): 50mm |
| Resolution | Up to 0.0003μm |
| Cutoff Lengths (λc) | 0.08, 0.25, 0.8, 2.5, 5, 8, 10 mm |
| Repeatability | < 3% (Skid-less Mode) / < 1.5% (Skidded Mode) |
| Filters | Gauss, 2RC |
| Interface | USB, RS232, Touch Screen |
| Power Supply | Built-in Rechargeable Li-ion Battery / AC Adapter |
Supported Measurement Parameters
| Standard | Profile | Key Parameters |
|---|---|---|
| ISO 1997 | R / P / W | Ra, Rz, Rq, Rt, Rp, Rv, Rsk, Rku, Rc, RSm, Rmr, Wa, Wq, Wz, Wt, Pa, Pz, Pt... |
| JIS 2001 | R / P / W | Ra, Rq, Rz, RzJIS, Rp, Rv, Rku, Rc, RSm, Wa, WzJIS... |
| ANSI | R / W | Ra, Rq, Rz, Rt, Rmax, Rpm, Wa, Wq, Wz, Wt, Wmax... |
Click Here to visit the product webpage
